July 2004 issue
Cover illustration: Left: A three-dimensional view of a new diffractometer dedicated to X-ray resonant magnetic scattering in the soft X-rays range. Upper right: sketch of the reflectometer showing the possible movements. Bottom right: energy-dependent circularly polarised X-ray reflectivity from an Ir/Fe70Mn30/Ir/Al2O3 thin film in the vicinity of the Fe L3 edge obtained for two opposite directions of a longitudinally applied magnetic field as well as the asymmetry ratio and its simulation. See Jaouen, Tonnerre, Kapoujian, Taunier, Roux, Raoux and Sirotti, pages 353-357.