November 2008 issue
Cover illustration: Schematic of an X-ray reflection interface microscope (see Fenter, Park, Kohli & Zhang, pages 558-571). This microscope images the physical topography (e.g. steps) on a surface through full-field imaging of phase contrast in the X-ray beam reflected from the surface. The images at the bottom illustrate the control of image contrast obtained at an orthoclase (001) surface (left: at the specular reflection condition; right: +0.02° off the specular reflection condition). The image contrast is controlled by changes to the incident angle through the variation of the local interfacial structure factor.