Development of a hard X-ray delay line for X-ray photon correlation spectroscopy and jitter-free pump–probe experiments at X-ray free-electron laser sources

Roseker, W.; Franz, H.; Schulte-Schrepping, H.; Ehnes, A.; Leupold, O.; Zontone, F.; Lee, S.; Robert, A.; Grübel, G.

doi:10.1107/S0909049511004511

Figure 3
Variations of reflected I_r (solid line) and forward-diffracted I_fd (dashed line) intensities as a function of $[\Delta\theta]$ = $[\theta-\theta_{\rm{B}}]$ , where $[\theta]$ is the incident angle and $[\theta_{\rm{B}}]$ = 45°. Calculations were performed using the XOP 2.11 package (Dejus & Sanchez del Rio, 1996

) at E = 8.39 keV for a symmetric Si(511) oriented in (a) Laue geometry with a crystal thickness t = 19 µm and (b) Bragg geometry with t = 6 µm.