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Figure 3
Variations of reflected Ir (solid line) and forward-diffracted Ifd (dashed line) intensities as a function of [\Delta\theta] = [\theta-\theta_{\rm{B}}], where [\theta] is the incident angle and [\theta_{\rm{B}}] = 45°. Calculations were performed using the XOP 2.11 package (Dejus & Sanchez del Rio, 1996BB8) at E = 8.39 keV for a symmetric Si(511) oriented in (a) Laue geometry with a crystal thickness t = 19 µm and (b) Bragg geometry with t = 6 µm.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 18| Part 3| March 2011| Pages 481-491
doi:10.1107/S0909049511004511
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