A scanning Kelvin probe for synchrotron investigations: the in situ detection of radiation-induced potential changes

Salgin, B.; Vogel, D.; Pontoni, D.; Schröder, H.; Schönberger, B.; Stratmann, M.; Reichert, H.; Rohwerder, M.

doi:10.1107/S0909049511047066

Figure 3
Potential map of a sapphire (0001) single-crystal surface during X-ray irradiation. In this representation the X-ray beam is passing through the centre of the x-axis and is parallel to the y-axis.