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Figure 1
Schematic illustrations of the beam geometry in a plane-parallel single crystal (a) in an unbent crystal, (b) in a bent crystal, and (c) in a crystal for a two-beam MBL interferometer. L is the distance between the incident point of the X-rays and the crystal edge, and H is the crystal thickness. [{{\bf E}_{\rm{0}}}] and [{\bf E}_{{h}}^{ \langle{\rm{1}} \rangle}] are the electric fields of the incident beam and the diffracted beam. [{\bf{E}}_{{h}}^{\,\prime}] is the electric field of the diffraction beam in the direction of the diffracted beam at the exit point (L,z) from the lateral surface. The refracted beams in the BL and BBL modes are denoted by the Poynting vectors [{{\bf S}_{{\rm{BL}}}}] and [{{\bf S}_{{\rm{BBL}}}}], respectively. In (c) the second subscript 1 (2) of the electric field [{{\bf E}_{\rm{0}}}] and the Poynting vectors [{{\bf S}_{{\rm{BL}}}}] and [{{\bf S}_{{\rm{BBL}}}}] denotes the beam passing through the upper (lower) side of the platinum wire.

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ISSN: 1600-5775
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