Figure 2
(a) Geometries of beams and a Si strip fixed at one end. (b) Schematic diagram of the measuring system. Synchrotron radiation X-rays are monochromated by a Si 111 double crystal. Diffraction intensities ([P_{{h}}^{\langle1\rangle}] and [{P_{{h}}^{\,\prime}}]) are measured either by scintillation counter (SC) or nuclear plate. (c) Schematic diagram of the beam geometry around the MBL interferometer.  [article HTML]