Spherical analyzers and monochromators for resonant inelastic hard X-ray scattering: a compilation of crystals and reflections

Gog, T.; Casa, D.M.; Said, A.H.; Upton, M.H.; Kim, J.; Kuzmenko, I.; Huang, X.; Khachatryan, R.

doi:10.1107/S0909049512043154

Figure 2
Partial map of the analyzer near-backscattering reflections. For the various relevant energies the intrinsic energy resolution is shown. The area of the markers is proportional to the integrated reflectivity.