![[Figure 5]](wa5043fig5mag.jpg)
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Figure 5
Diffraction pattern from a reference powder sample of silicon (NIST) using the all-in-vacuum diffractometer at an X-ray wavelength ![[lambda]](/logos/entities/lambda_rmgif.gif) = 1.054 Å from beamline I911-1 at MAX-lab. ![[article HTML]](../../../../../graphics/viewarticleborder.gif)
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![[Figure 5]](wa5043fig5.jpg)
© International Union of Crystallography 2013
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Figure 5
Diffraction pattern from a reference powder sample of silicon (NIST) using the all-in-vacuum diffractometer at an X-ray wavelength = 1.054 Å from beamline I911-1 at MAX-lab.
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