(Colour online) Schematics of the full-field imaging experiment (the case of the bend sample, 0.3 mm-thick substrate). The parallel incident X-ray beam is focused by the sample, both in the longitudinal and sagittal directions. The result is a distorted image on the area detector. Images at several distances are taken: (1) close to focal point; (2) out of the focal point and (3) far away from the focal point. The structure of the sample is similar to the one shown in Fig. 1(b).