Figure 1
(a) Sketch of the photoelectron emission process. (b) Angle dependences of the X-ray reflectivity R, absorption depth d and the corresponding normal-emission IPE for Cu at h[nu] = 400 eV in the FA (solid line) and FOVL (dashed) regimes. The decrease of d combined with an increase of R towards more grazing [alpha] forms the peak of IPE, prominent in the FA regime and only moderate in the FOVL regime.  [article HTML]