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Figure 5
(a) Detailed SEM micrograph of the fabricated bridge structure revealing asymmetric etching effects, marked by green arrows. (b) SEM micrograph revealing cracks in the investigated structure, highlighted by red arrows. (c) Mesh of the FEM model used for calculation, which includes the defects displayed in (a) and (b).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 21| Part 1| November 2014| Pages 111-118
doi:10.1107/S1600577513025459
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