High-resolution thermal imaging with a combination of nano-focus X-ray diffraction and ultra-fast chip calorimetry

Rosenthal, M.; Doblas, D.; Hernandez, J.J.; Odarchenko, Y.I.; Burghammer, M.; Di Cola, E.; Spitzer, D.; Antipov, A.E.; Aldoshin, L.S.; Ivanov, D.A.

doi:10.1107/S1600577513024892

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 5
(a) One-dimensional-reduced WAXS curves measured in the temperature range from 400 to 440 K at a rate of 20 K min⁻¹. The insets show diffraction intensities and their first derivatives for the 202 reflection (heating ramp) and 103 reflection (cooling ramp). (b) Amplitude of the temperature modulation recorded simultaneously with X-ray diffraction for the heating ramp. The inset gives the curve corresponding to cooling and two-dimensional WAXS patterns measured at different temperatures. (c) Quasi-isothermal experiment at 430 K showing the heating effect of a fast-shutter-modulated X-ray beam (top). The resulting variation of the particle temperature and modulation amplitude is shown in the middle and bottom panels, respectively.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 21| Part 1| November 2014| Pages 223-228

doi:10.1107/S1600577513024892

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