Wide-area X-ray mapping for a fixed test sample using a fibre scan. (a) Test sample composed of cobalt, nickel and copper films, of thickness 15 µm, 10 µm and 10 µm, respectively. (b) Absorbance map at a photon energy of 12.4 keV. The scan step and integration time were set to be 500 µm and 1 s, respectively, in order to save the measurement time, although the potential spatial resolution is 50 µm as obtained from Fig. 5(a). (c) Graphs showing X-ray absorption spectra at the positions indicated on the absorbance map.