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Figure 8
Effect of the analyzer focal axis and incident beam mismatch of ±1 mm in the slit-parallel direction (LAD mode, Ek = 800 eV, Ep = 120 eV): (a) angle-resolved image of the slit array defining angular steps of 1°, and (b) illumination band produced by restricted analyzer iris. The misfit results in displacement and skewing of these images.

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ISSN: 1600-5775
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