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Figure 7
Results from data processing by the KOHMOKU subprogram. (a) Merged diffraction pattern from a copper oxide particle (left). The line profiles along A–B and C–D are illustrated in the right-hand panel. The profiles of C–D are shifted appropriately for clarity. (b) Classification of 3508 successfully merged diffraction patterns with respect to the Csym scores and the diffraction intensity in the small-angle region.

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RADIATION
ISSN: 1600-5775
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