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Figure 1
(Top) The experimentally measured (Turner et al., 2016BB14) and simulated intensity profile along the x-axis at the entrance aperture of the FEH for the current status of the machine. The simulated profile is obtained by integrating the two-dimensional distribution (bottom) along the y-axis. The x-axis is parallel to the optical axis of the transport mirror. The height error of the latter results in amplitude aberrations at the FEH. (Bottom) The two-dimensional simulated intensity distribution at the entrance aperture of the FEH for the current status of the machine. The y-axis intensity retains its almost ideal Gaussian profile.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 24| Part 4| July 2017| Pages 738-743
https://doi.org/10.1107/S1600577517007032
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