view article
Figure 7
TFU (i: 14500–15000, N = 501) of the corrected scattering data of SiO2 glass with intensity of the order of 106 photons, as a function of measurement time for correction factors. The single-step process without the mask and the multi-step with and without the mask are indicated.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 26| Part 3| May 2019| Pages 762-773
https://doi.org/10.1107/S1600577519002145
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS