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 | JOURNAL OF SYNCHROTRON RADIATION |
Determination of X-ray via intensity correlation measurement of Erratum
aRIKEN SPring-8 Center, 1-1-1, Kouto, Sayo, Hyogo 679-5148, Japan, and bJapan Synchrotron Radiation Research Institute, 1-1-1 Kouto, Sayo, Hyogo 679-5198, Japan
*Correspondence e-mail: inoue@spring8.or.jp
Corrections to equations and experimental results in the paper by Inoue et al. [(2019![[Inoue, I., Tamasaku, K., Osaka, T., Inubushi, Y. & Yabashi, M. (2019). J. Synchrotron Rad. 26, 2050-2054.]](../../../../../../logos/arrows/s_arr.gif "Inoue, I., Tamasaku, K., Osaka, T., Inubushi, Y. & Yabashi, M. (2019). J. Synchrotron Rad. 26, 2050-2054."){kind=small}
). J. Synchrotron Rad. 26, 2050–2054] are made.
The correct versions of equations (2) and (3) in the paper by Inoue et al. (2019) are as follows:
![[{g}_{f}^{\left(2\right)} \left({{r}}_{1},{{r}}_{2}\right) = 1 + {{{1}\over{2}} \big|\,j\,\left({{r}}_{1},{{r}}_{2}\right)\big|}^{2} \int\Pi \left(\tau\right)\,{\big|\gamma\left(\tau\right)\big|}^{2} \,{\rm{d}}\tau, \eqno(2)]](teximages/gb5117fd1.gif){kind=small}
![[{g}_{f}^{\left(2\right)}\left({{r}}_{1},{{r}}_{2}\right) = 1 + {{1}\over{2}} {g}_{0}^{(2)} \exp\left(-{{\Delta{x}^{2}}\over{2{l}_{x}^{\,2}}}\right) \exp\left(-{{\Delta{y}^{2}}\over{2{l}_{y}^{\,2}}}\right). \eqno(3)]](teximages/gb5117fd2.gif){kind=small}
The additional factors of 1/2 on the right-hand sides of these equations represent a decrease in intensity correlation of due to the unpolarized nature of the fluorescence (Trost et al., 2020; Goodman, 2007).
Accordingly, the degree of intensity correlation [g0(2)] and the XFEL duration [![[2\sqrt{2\ln2}\,{\sigma_t}]](teximages/gb5117fi2.gif){kind=small}
] evaluated by the experiment also need to be corrected; the values of g0(2) and shown in Section 4 should be 0.0262 ± 0.008 and 5.1 ± 0.2 fs, respectively. The determined XFEL duration is consistent with previous estimations by other methods (Inubushi et al., 2017; Inoue et al., 2018), in which the XFEL duration was evaluated to be less than 10 fs. Although the determined XFEL duration is shorter than the electron bunch duration measured by a radiofrequency deflector (∼10 fs in FWHM), such discrepancy could be explained by insufficient time resolution of the deflector (∼10 fs) (Ego et al., 2015).
Acknowledgements
We thank the authors of Trost et al. (2020) for pointing out the errors in the original paper.
References
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