Forthcoming article in Acta Crystallographica Section A Foundations and Advances
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Acta Crystallographica Section A: Foundations and Advances covers theoretical and fundamental aspects of the structure of matter. The journal is the prime forum for research in diffraction physics and the theory of crystallographic structure determination by diffraction methods using X-rays, neutrons and electrons. The structures include periodic and aperiodic crystals, and non-periodic disordered materials, and the corresponding Bragg, satellite and diffuse scattering, thermal motion and symmetry aspects. Spatial resolutions range from the subatomic domain in charge-density studies to nanodimensional imperfections such as dislocations and twin walls. The chemistry encompasses metals, alloys, and inorganic, organic and biological materials. Structure prediction and properties such as the theory of phase transformations are also covered.en-gbCopyright (c) 2024 International Union of CrystallographyInternational Union of CrystallographyInternational Union of Crystallographyhttps://journals.iucr.orgtext/htmltextActa Crystallographica Section A: Foundations and Advances covers theoretical and fundamental aspects of the structure of matter. The journal is the prime forum for research in diffraction physics and the theory of crystallographic structure determination by diffraction methods using X-rays, neutrons and electrons. The structures include periodic and aperiodic crystals, and non-periodic disordered materials, and the corresponding Bragg, satellite and diffuse scattering, thermal motion and symmetry aspects. Spatial resolutions range from the subatomic domain in charge-density studies to nanodimensional imperfections such as dislocations and twin walls. The chemistry encompasses metals, alloys, and inorganic, organic and biological materials. Structure prediction and properties such as the theory of phase transformations are also covered.urn:issn:0108-7673Acta Crystallographica Section A Foundations and Advancesdaily2002-01-01T00:00+00:001urn:issn:0108-7673med@iucr.orgActa Crystallographica Section A Foundations and AdvancesCopyright (c) 2024 International Union of CrystallographyForthcoming article in Acta Crystallographica Section A Foundations and Advanceshttp://journals.iucr.org/logos/rss10a.gif
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Still imageUniversal simulation of absorption effects for X-ray diffraction in reflection geometry
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A ray-tracing algorithm for the simulation of absorption effects for arbitrary rasterized samples is presented. The algorithm is used to analyze how the absorption correction is influenced by the lateral and vertical dimensions of the material distribution in a sample surface.Johannes Dallmann et al.enurn:issn:2053-2733Copyright (c) 2024 International Union of Crystallographytext/htmltextA ray-tracing algorithm for the simulation of absorption effects for arbitrary rasterized samples is presented. The algorithm is used to analyze how the absorption correction is influenced by the lateral and vertical dimensions of the material distribution in a sample surface.doi:10.1107/S2053273324003292A ray-tracing algorithm for the simulation of absorption effects for arbitrary rasterized samples is presented. The algorithm is used to analyze how the absorption correction is influenced by the lateral and vertical dimensions of the material distribution in a sample surface.International Union of CrystallographyUniversal simulation of absorption effects for X-ray diffraction in reflection geometryMICROABSORPTION; ABSORPTION CORRECTIONS; MICROSTRUCTURE; RAY-TRACING; SURFACE ROUGHNESS; POWDER DIFFRACTIONThe description of octahedral crystals using five parameters
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A method for the unambiguous description of the real octahedral crystal form using its five linear parameters is proposed. It can be considered as an alternative to other geometrical approaches to describe the shape of crystals.Stepenshchikov & Pavlushinenurn:issn:2053-2733Copyright (c) 2024 International Union of Crystallographytext/htmltextA method for the unambiguous description of the real octahedral crystal form using its five linear parameters is proposed. It can be considered as an alternative to other geometrical approaches to describe the shape of crystals.doi:10.1107/S2053273324003097A method for the unambiguous description of the real octahedral crystal form using its five linear parameters is proposed. It can be considered as an alternative to other geometrical approaches to describe the shape of crystals.International Union of CrystallographyThe description of octahedral crystals using five parametersOCTAHEDRA; DIAMOND; MORPHOLOGY; GEOMETRY; REAL FORMDevelopment of an innovative diffraction scattering theory of X-rays and electrons in imperfect crystals
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The Liouville–Neumann-type series formalism is applied to solve the X-ray and electron boundary-value Cauchy problems formulated in the form of the matrix Volterra integral equation of the second kind. Using the two-stage resolvent solution of the second order, this approach is supported by straightforward calculation of the electron bright- and dark-field contrasts of the edge dislocation in a thick foil.Felix N. Chukhovskiienurn:issn:2053-2733Copyright (c) 2024 International Union of Crystallographytext/htmltextThe Liouville–Neumann-type series formalism is applied to solve the X-ray and electron boundary-value Cauchy problems formulated in the form of the matrix Volterra integral equation of the second kind. Using the two-stage resolvent solution of the second order, this approach is supported by straightforward calculation of the electron bright- and dark-field contrasts of the edge dislocation in a thick foil.doi:10.1107/S2053273324002730The Liouville–Neumann-type series formalism is applied to solve the X-ray and electron boundary-value Cauchy problems formulated in the form of the matrix Volterra integral equation of the second kind. Using the two-stage resolvent solution of the second order, this approach is supported by straightforward calculation of the electron bright- and dark-field contrasts of the edge dislocation in a thick foil.International Union of CrystallographyDevelopment of an innovative diffraction scattering theory of X-rays and electrons in imperfect crystalsX-RAY DIFFRACTION SCATTERING; ELECTRON DIFFRACTION SCATTERING; BOUNDARY-VALUE CAUCHY PROBLEM; RESOLVENT-TYPE SOLUTION