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Figure 1
(a) ORTEP (Burnett & Johnson, 1996BB13) plot of CH8N4SiF6 with the atomic labeling. Displacement ellipsoids are drawn at the 50% probability level. (b) ORTEP plot of (CH7N4)2SiF6·2H2O with the atomic labeling. Displacement ellipsoids are drawn at the 50% probability level.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
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