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Figure 1
Experimental data (+) and the calculated (solid line) diffraction profile from the Rietveld refinement of moganite-type PON using neutron diffraction data. The intensity is in arbitrary units and the difference profile is on the same scale. Vertical bars indicate the positions of all calculated reflections for the α-quartz-type phase (above) and the moganite-type phase (below). The 310 reflection is indicated by an asterisk (*).

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
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