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Figure 1
The observed, calculated and difference curves from the 698 K Rietveld refinement of Na0.5Bi0.5TiO3. The marks indicate the positions of the reflections. The low-angle data (32 < 2θ < 50°), showing the first two superstructure peaks, are magnified in the insert.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
Volume 56| Part 3| June 2000| Pages 426-430
doi:10.1107/S0108768100001166
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