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Figure 4
High-resolution synchrotron XRPD pattern [λ = 0.650515 (1) Å] of β-SSS (upper), the pattern as calculated from the refined crystal structure (middle) and the difference between these patterns (lower).

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
Volume 57| Part 3| May 2001| Pages 372-377
doi:10.1107/S0108768100019121
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