Structure of compounds E(SnMe3)4 (E = Si, Ge) as seen by high-resolution X-ray powder diffraction and solid-state NMR

Dinnebier, R.E.; Bernatowicz, P.; Helluy, X.; Sebald, A.; Wunschel, M.; Fitch, A.; Smaalen, S. van

doi:10.1107/S0108768101016688

Acta Crystallographica Section B
Acta Crystallographica
Section B STRUCTURAL SCIENCE, CRYSTAL ENGINEERING AND MATERIALS

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Figure 5
Rietveld refinement of the high-temperature phase of (1) at 353 K using spherical harmonics of first order. The highly structured background is caused by rotational disorder.

STRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS

ISSN: 2052-5206

Volume 58| Part 1| February 2002| Pages 52-61

https://doi.org/10.1107/S0108768101016688

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