Single-crystal X-ray diffraction and electron-microscopy study of multiple-twinned Sr3(Ru0.336,Pt0.664)CuO6

Friese, K.; Kienle, L.; Duppel, V.; Luo, H.; Lin, C.

doi:10.1107/S0108768102023510

Acta Crystallographica Section B
Acta Crystallographica
Section B STRUCTURAL SCIENCE, CRYSTAL ENGINEERING AND MATERIALS

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Figure 4
HRTEM micrograph taken at the boundary between a darker and brighter stripe. Simulations of the images are inserted (left: zone axis [100]; right: zone axis [110]; $[\Delta]$ f = –30 nm; thickness = 7.7 nm). The arrows highlight vertical lines of spots with equal intensity.

STRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS

ISSN: 2052-5206

Volume 59| Part 2| March 2003| Pages 182-189

doi:10.1107/S0108768102023510

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