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Figure 3
The temperature dependence of (a) a, (b) c and (c) cell volume for ZrMo2O8 (open points) and HfMo2O8 (closed points) from X-ray diffraction data. The Rietveld-derived standard uncertainties (not plotted) were 0.0004 Å, 0.0008 Å and 0.1 Å3 for a, c and the cell volume at 300 K, and varied little with temperature. (d) Volume thermal expansion of ZrMo2O8 from X-ray (open points) and neutron (closed points) data.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
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