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Figure 6
Rietveld refinement (GSAS) plots of the [Fe(teeb)6](BF4)2 structures (a) at 300 K (M1), (b) at 300 K (M2) and (c) at 90 K: experimental diffraction pattern (upper), the pattern as calculated from the refined crystal structure (middle), the difference between these patterns (lower) and reflection positions (vertical lines).

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
Volume 60| Part 5| September 2004| Pages 528-538
doi:10.1107/S0108768104015356
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