view article

Figure 4
Weighted observed, calculated and difference XRD powder profiles for sample B after (a) DDM and (b) Rietveld refinement. The bottom curve in (a) is the sample holder scattering profile.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
Follow Acta Cryst. B
Sign up for e-alerts
Follow Acta Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds