Extremely long period-stacking structure in the Sb–Te binary system

Kifune, K.; Kubota, Y.; Matsunaga, T.; Yamada, N.

doi:10.1107/S0108768105017714

Acta Crystallographica Section B
Acta Crystallographica
Section B STRUCTURAL SCIENCE, CRYSTAL ENGINEERING AND MATERIALS

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Figure 1
Electron diffraction patterns from a single-crystal grain of Sb₇₂Te₂₈. The grain was rotated around the c* axis, and ϕ indicates the angle of rotation from the [100] direction (a). Symbol P indicates a fundamental spot, A and B correspond to superlattice spots.

STRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS

ISSN: 2052-5206

Volume 61| Part 5| September 2005| Pages 492-497

doi:10.1107/S0108768105017714

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