Extremely long period-stacking structure in the Sb–Te binary system

Kifune, K.; Kubota, Y.; Matsunaga, T.; Yamada, N.

doi:10.1107/S0108768105017714

Acta Crystallographica Section B
Acta Crystallographica
Section B STRUCTURAL SCIENCE, CRYSTAL ENGINEERING AND MATERIALS

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Figure 4
Rietveld fittings for Sb₇₂Te₂₈ and Sb₈₅Te₁₅. Observed (+) and calculated (blue line) X-ray diffraction profiles of Sb₇₂Te₂₈ (top) and Sb₈₅Te₁₅ (bottom) at 90 K. The wavelength of incident X-rays is 0.42137 Å. A difference curve (observed–calculated) appears at the bottom of each figure. Weak reflection peaks due to the Sb₂O₃ phase were observed in the profile and a two-phase analysis was carried out. The reflection markers are indicated by vertical bars under the profile (upper: Sb–Te phase; lower: Sb₂O₃ phase).

STRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS

ISSN: 2052-5206

Volume 61| Part 5| September 2005| Pages 492-497

doi:10.1107/S0108768105017714

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