 | Acta Crystallographica Section B Acta Crystallographica Section B STRUCTURAL SCIENCE, CRYSTAL ENGINEERING AND MATERIALS |
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![[Figure 2]](bk5024fig2mag.jpg)
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Figure 2
Extract (1.8 < d < 2.4 Å) from the diffraction pattern recorded in the back-scattering detectors from Nd0.7Ti0.9Al0.1O3 at room temperature. The peaks are indexed on a cell of dimensions (referred to the edge of the cubic aristotype) 2 × 2 × 2. Crosses represent the observed data. The continuous lines are fits obtained by the Rietveld method using the proposed structure in C2/m, the vertical marks show the peak positions expected in this structure and the line beneath the pattern records the difference between the observed pattern and that calculated in the Rietveld analysis. The inset shows details of the 131/311/113 reflections (boxed region). The solid line through the data points is the envelope of the Voigt/sharp-edged exponential three-peak fit and the vertical lines indicate the individual peak intensities and positions (with error bars). |
![[Figure 2]](bk5024fig2.jpg)
| STRUCTURAL SCIENCE CRYSTAL ENGINEERING MATERIALS |
ISSN: 2052-5206
