Structure model for the τ(μ) phase in Al–Cr–Si alloys deduced from the λ phase by the strong-reflections approach

Zhang, H.; He, Z.B.; Oleynikov, P.; Zou, X.D.; Hovmöller, S.; Kuo, K.H.

doi:10.1107/S0108768105035779

Acta Crystallographica Section B
Acta Crystallographica
Section B STRUCTURAL SCIENCE, CRYSTAL ENGINEERING AND MATERIALS

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Figure 1
Electron diffraction patterns from (a) the λ and (b) the τ(μ) approximants taken at 100 kV along the c axis, both are on the same scale and with similar orientation. The corresponding strongest diffraction spots in the two approximants are marked by arrows. The diffraction pattern of λ in (a) shows p6 symmetry, while that of τ(μ) in (b) shows p6m symmetry. Note, however, that the strongest diffraction spots in λ (a) have approximate p6m symmetry.

STRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS

ISSN: 2052-5206

Volume 62| Part 1| January 2006| Pages 16-25

doi:10.1107/S0108768105035779

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