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Figure 1
Rietveld refinement of the synchrotron X-ray powder diffraction data of the zirconium oxide nanoparticles. A magnified view of the peak profile in the 2θ range from 80 to 140° is inserted. Red points and the green line denote the observed and calculated intensities, respectively. The difference between the observed and calculated intensities is drawn by a blue line below the profile. Up and down green short verticals denote the calculated peak positions of the monoclinic and tetragonal phases, respectively.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
Volume 62| Part 1| January 2006| Pages 161-164
doi:10.1107/S0108768105030570
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