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Figure 5
Comparison of the structures using the program OFIT from the SHELTL program suite (Bruker, 2001BB2). The same view has been used as in Figs. 1[link] and 2[link]. (a) Overlay of (I) at 293 K (dashed lines) and 230 K. (b) Overlay of (I) at 230 K (dashed lines) and 100 K. (c) Overlay of (II) at 230 K (dashed lines) and 100 K. (d) Overlay of (III) at 293 K (dashed lines) and 230 K. (e) Overlay of (III) at 230 K (dashed lines) and 100 K.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
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