Structure of Ce2RhIn8: an example of complementary use of high-resolution neutron powder diffraction and reciprocal-space mapping to study complex materials

Moshopoulou, E.G.; Ibberson, R.M.; Sarrao, J.L.; Thompson, J.D.; Fisk, Z.

doi:10.1107/S0108768106003314

Acta Crystallographica Section B
Acta Crystallographica
Section B STRUCTURAL SCIENCE, CRYSTAL ENGINEERING AND MATERIALS

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Figure 7
Expanded region of the diffraction profile from 2.43 to 2.47 Å corresponding to the 005 reflection for the two structural models explored in this study: (a) single phase and (b) two-phase model. Crosses are experimental points; green solid lines are calculated patterns from full-profile Rietveld refinements, and pink solid lines are difference curves (observed minus calculated). In (a), the black vertical tick mark represents the calculated peak position of the 005 reflection of the single phase. In (b) the yellow and black vertical tick marks represent the calculated peak positions of the 005 reflection of the majority and minority phase, respectively.

STRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS

ISSN: 2052-5206

Volume 62| Part 2| March 2006| Pages 173-189

doi:10.1107/S0108768106003314

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