Structure of Ce2RhIn8: an example of complementary use of high-resolution neutron powder diffraction and reciprocal-space mapping to study complex materials

Moshopoulou, E.G.; Ibberson, R.M.; Sarrao, J.L.; Thompson, J.D.; Fisk, Z.

doi:10.1107/S0108768106003314

Acta Crystallographica Section B
Acta Crystallographica
Section B STRUCTURAL SCIENCE, CRYSTAL ENGINEERING AND MATERIALS

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Figure 8
Expanded region of the diffraction profile from 2.53 to 2.60 Å containing the 014 and 113 reflections for the two structural models explored in this study: (a) single-phase and (b) two-phase model. The 014 reflection is the very weak one at d = 2.558 Å and 113 is the strong reflection at d = 2.565 Å. Crosses are experimental points; green solid lines are calculated patterns from full-profile Rietveld refinements, and pink solid lines are difference/e.s.d. curves (observed minus calculated). In (a) the black vertical tick mark represents the calculated peak positions of the 014 and 113 reflections of the single phase. In (b) the yellow vertical tick marks represent the calculated peak positions of the 014 and 113 reflections of the majority phase and the black vertical tick marks represent the calculated peak positions of the 014 and 113 reflections of the minority phase.

STRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS

ISSN: 2052-5206

Volume 62| Part 2| March 2006| Pages 173-189

doi:10.1107/S0108768106003314

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