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Figure 1
Part of the X-ray powder diffractogram of CaAlSi at room temperature. The Bragg positions for the six- and fivefold superstructures shown here were calculated from the pattern-matching refinements of the cell parameters of the average structure. The dotted line shows the measured diffractogram. The arrows point to peaks from oxidized material. The solid line represents the simulated diffractogram using the refined structures from single-crystal X-ray diffraction.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
Volume 62| Part 5| September 2006| Pages 710-718
doi:10.1107/S0108768106025900
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