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Figure 2
X-ray powder diffraction pattern of BaGeO3 with Cu Kα1 radiation. The high-angle region is shown scaled by a factor of 10 for clarity. Also given are the reflection positions of the main phase and the difference to the calculated pattern. Residuals of the Rietveld fitting are Rwp  =  0.042, χ2 = 1.8, RBragg = 0.045. Note that at 13.9 and 36.2° two broad peaks appear, which probably result from some amorphous phase and have been modelled as part of the background.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
Volume 62| Part 6| November 2006| Pages 1002-1009
doi:10.1107/S0108768106039140
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