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Figure 2
Final observed (crosses), calculated (solid line) and difference (below) diffraction profile for W50(X + U) Rietveld refinement of (I).

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
Volume 63| Part 3| May 2007| Pages 477-484
doi:10.1107/S0108768107006568
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