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Figure 3
Profile-matching of TAHS-II and TAHS-I phases with Si standard at 297.4 (1) and at 427.4 (1) K, respectively.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
Volume 65| Part 1| January 2009| Pages 36-44
doi:10.1107/S0108768108041876
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