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Figure 4
Observed (+) and calculated (black line) X-ray diffraction profiles for Sb8Te3 at 831 K by the four-dimensional Rietveld analysis. The reflection positions are indicated by vertical spikes below the diffraction patterns (black solid line: the fundamental reflection, gray broken line: the superstructure reflection). A difference curve (observed − calculated) is shown at the bottom.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
Volume 67| Part 5| September 2011| Pages 381-385
doi:10.1107/S0108768111033738
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