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Figure 1
Scattered X-ray intensity for dimeric TDIC form A as a function of diffraction angle 2θ. The observed pattern (diamonds), the best Rietveld-fit profile (a), the difference curve between observed and calculated profile (b), and the reflection markers (vertical bars) are shown. The wavelength was λ = 1.5406 Å. The higher-angle part of the plot starting at 32° 2θ is enlarged for clarity.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
Volume 68| Part 2| March 2012| Pages 204-208
doi:10.1107/S0108768112008592
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