Two novel Zn-MOFs: structures and characterization

Zheng, R.; Han, L.; Pan, Q.; Christensen, K.E.; Ren, T.

doi:10.1107/S0108768112007999

Acta Crystallographica Section B
Acta Crystallographica
Section B STRUCTURAL SCIENCE, CRYSTAL ENGINEERING AND MATERIALS

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Figure 9
XRD patterns of thermal treated sample (a) HUT-11 and (b) HUT-12 in muffle oven with 5 K min⁻¹ and kept 30 min at each sample point in atmosphere.

STRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS

ISSN: 2052-5206

Volume 68| Part 2| March 2012| Pages 158-163

doi:10.1107/S0108768112007999

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