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Figure 5
Enlarged view of the fit reported in Fig. 4[link] relative to the Rietveld fit performed using both MS and RS models of the powder pattern collected at 8.8 GPa, in the angular range 8–10 ° (bottom) and zoomed view of two portions of the pattern fitted with MS only (top left) and RS only (top right) structure. It is apparent that the best fit of all the diffraction peaks is achieved only supposing that both phases are present.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
Volume 68| Part 3| May 2012| Pages 266-274
doi:10.1107/S0108768112011226
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