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Figure 3
Scattered X-ray intensities of the Hc phase as a function of diffraction angle. The observed pattern (diamonds) measured in Debye–Scherrer geometry, the best Rietveld fit profile (line) and the difference curve between the observed and calculated profiles (below) are shown. (a) The pattern collected at 297 K contains two major phases, Hc and cHc, and impurities of H12Al2Ca3O12 and CaCO3 (reflection positions 1, 2, 3, 4 respectively). (b) At 347 K only one major phase is present, cHc and impurities of H12Al2Ca3O12 and CaCO3 (reflection positions 1, 2, 3, respectively).

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
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