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Figure 2
Observed (+) and calculated (gray line) X-ray diffraction profiles for Ag3.4In3.7Sb76.4Te16.5 (crystallized into an A7-type single structure) at 545 K by four-dimensional Rietveld analysis in the commensurate case. A difference curve (observed − calculated) appears at the top of the figure; reflection markers are indicated by vertical spikes below the diffraction patterns: the longer ones are for the peaks of the main reflections and the shorter ones for the satellites.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
Volume 68| Part 6| October 2012| Pages 559-570
doi:10.1107/S0108768112039961
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