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Figure 2
Scattered X-ray intensities of polymorphs (I), (II), (III) and (IV) (from top to bottom) of dithianon at ambient conditions as a function of diffraction angle 2θ. The observed pattern (diamonds) in Debye–Scherrer geometry, the best Rietveld fit profiles (line) and the difference curve between the observed and the calculated profiles (below) are shown. The high-angle parts are enlarged for clarity.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
Volume 68| Part 6| October 2012| Pages 661-666
doi:10.1107/S0108768112036191
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