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Figure 2
(a) Final Rietveld plot of the structure refinement of sample C05 with the refined formula Mg1.04Co0.96(Al2.07Si0.93)(Al2.09Si3.91)O18. The calculated XRD pattern is compared with observed data. Small vertical bars (below the pattern) indicate the positions of allowed hkl reflections. The difference between the observed and the calculated profiles is plotted below the diffraction pattern (shifted down by a 2000 counts). (b) Results of determining the crystalline microstructure for sample C10. Selected experimental line profiles after background correction (circles) compared with corresponding line profiles calculated in accordance with the C10 microstructure characteristics (thick line). The difference between the observed and the calculated profiles is plotted shifted down by 2000 counts (thin line).

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
Volume 69| Part 2| February 2013| Pages 110-121
doi:10.1107/S2052519213001401
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