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Figure 3
Variation in the position of the C-S-H basal reflection as a function of structural Ca/Si ratio. Published XRD patterns having too weak a diffraction intensity or showing the presence of high amounts of portlandite were excluded. Note that the actual Ca/Si ratio may be slightly overestimated for samples from Renaudin et al. (2009BB50) that have Ca/Si > 1.5, because of the presence of portlandite in their XRD pattern.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
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