 | Acta Crystallographica Section B Acta Crystallographica Section B STRUCTURAL SCIENCE, CRYSTAL ENGINEERING AND MATERIALS |
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![[Figure 1]](ps5035fig1mag.jpg)
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Figure 1
(Left vertical axis) Plots of the difference in atomic scattering factor, f, for an O atom versus sin θ/λ: dotted green line without thermal motion, orange and blue lines are for Uiso = 0.03 and 0.01 Å2, respectively. (Right vertical axis) Plot of the number of reflections per cell volume, N/V, versus resolution (black line). The vertical black dotted line represents the maximum resolution in sin θ/λ achieved with Cu Kα radiation, 0.6 Å−1 for a goniometer geometry that achieves a maximum resolution in sin θ/λ of 1.3 Å−1 with Mo Kα radiation. |
![[Figure 1]](ps5035fig1.jpg)
| STRUCTURAL SCIENCE CRYSTAL ENGINEERING MATERIALS |
ISSN: 2052-5206
